Coordinate Metrology Society Unveils Diverse Slate of Original Technical Papers and Presentations for CMSC 2016

Portable 3D Measurement Community Gather for the Coordinate Metrology Society Conference in Murfreesboro, TN

MURFREESBORO, TN (May 18, 2016) The Coordinate Metrology Society (CMS) announced today it has selected a slate of 25 technical papers and presentations for the 2016 Coordinate Metrology Society Conference (CMSC).  The 32nd annual gathering of the Coordinate Metrology Society will be held July 25 – 29, 2016 at the Embassy Suites by Hilton, Murfreesboro, Tennessee.

The CMSC serves the exclusive needs of professionals in the portable 3D measurement and scientific communities. The 5-day conference established its industry reputation decades ago with diverse and original technical presentations delivered by high-level experts and scientists from around the world.  The yearly event has served as a single-source educational platform for discussing ideas and theories, and discovering new and future metrology technologies. A full listing of the 2016 CMSC presentations and Conference Registration information can be found at

The CMS completed its peer-review of abstract submissions and selected technical presentations from industry veterans representing leading manufacturers and organizations such as Brookhaven National Laboratory, Triumph Aerostructures, NIST (National Institute of Standards and Technology), The Boeing Company, Argonne National Laboratory, Airbus Saint Nazaire, Electroimpact , National Physical Laboratory (NPL-UK), Lockheed Martin Aeronautics Company, Northrop Grumman Missions Systems, Stelia Aerospace, and the National Research Council of Canada. The roster includes speakers from prestigious educational institutions including the Ontario Institute of Technology and University College London.

This year's presentation roster will cover an interesting spectrum of topics including best practices, techniques, trends, technology breakthroughs and the successful use of portable 3D coordinate measurement systems, laser trackers, photogrammetry, laser radar, 3D scanners and sensors, inspection software and more. Examples of presentation topics include Data Analysis Techniques for Critical Aircraft Assembly Features, Metrology Controlling Aircraft Shape Technology (MCAST), Metrology – The Invisible Keystone of Civilization, and Photogrammetric Measurement of A350 Brackets and Riggings. The CMSC Technical Presentation lineup can be found online at 2016 CMSC Conference Agenda.

The CMSC attracts visitors from prominent science/research laboratories, educational institutions, and industries such as aerospace, satellite, automotive, shipbuilding, power generation, and general engineering. Attendees will find more than just technical presentations at CMSC including a new Measurement Zone and Educational Zone, workshops, Level-One and Level-Two Certification examinations, and networking events. The CMSC Exhibition Hall will feature portable coordinate measuring machines (PCMMs), software, and accessories supported by more than 40 OEMs and service providers. Attendees and exhibitors are encouraged to share their experiences, research, concepts and theory in the open, educational atmosphere of the conference.

About the Coordinate Metrology Society

The Coordinate Metrology Society is a membership of users, service providers, and OEM manufacturers of close-tolerance industrial coordinate measurement systems, software, and peripherals. The society gathers each year to gain knowledge of the advancements and applications of any measurement system or software solution that produces and uses 3D coordinate data. For more information about the CMS and how to join the organization, visit their web site at

About the Coordinate Metrology Society Conference

The Coordinate Metrology Society Conference is an annual event sponsored by the Coordinate Metrology Society. Established in 1984, the five-day conference is held each year at a different location, and attracts visitors from around the globe.  CMSC has achieved world renown for its comprehensive program of top-shelf technical papers and applications presentations given by industry experts from science/research laboratories and leading manufacturing industries. No other trade show rivals the high level of authoritative information provided by CMS members and master users of metrology instrumentation, software, and peripheral equipment for quality control, quality production, and precision assembly and metrology-aided alignment.